BISTel is the world leader in engineering equipment systems (EES) and AI applications for semiconductor smart manufacturing, announces a global, enterprise-wide collaboration with NXP Semiconductors which is the world leader in semiconductor solutions spanning IoT, automotive, and industrial sectors for continuous improvement.
BISTel will employ its award-winning manufacturing AI solutions, inclusive of chamber matching, Dynamic Fault Detection (DFD), eDatalzyer, and the GrandView® predictive analytics in all front-end NXP fabs in the United States and Europe under this new multi-year, multi-fab collaboration. Their intelligent manufacturing solutions gather and manage data, monitor the health of equipment, enhance process flows, examine large data, quickly identify root cause failures to mitigate risk, forecast issues before they occur, and expand the life of equipment through industry-leading predictive analytics.
BISTel helps customers decrease downtime, increase equipment utilization, upgrade yield, and attain significant production and engineering efficiencies across the factory. BISTel’s domain skill in global manufacturing, includes, industrial, flat panel, PCB/SMT, oil and gas, and semiconductor manufacturing also automotive, and pharmaceutical manufacturing.
BISTel’s broad range of continuous improvement software applications for more than 20 years has allowed the manufacturers to improve the performance of their equipment and production processes, resulting in increased engineering productivity, an improvement in yield, and reductions in system downtime.
The new agreement comprises of DFD fault detection, and, an innovative suite of machine learning-based root-cause analysis applications that rapidly pinpoint and resolve yield issues. It also includes BISTel’s new AI-powered GrandView APM, which is an asset performance management system. It monitors the health of critical assets, identifies anomalies, and provides predictive analytics that recognizes production problems before they occur. It even offers a remaining useful life (RUL) prediction of equipment.
Steve Frezon, Senior Vice President, Front End Operations at NXP stated that the customers demand zero-defect quality, and BISTel’s suite of applications allows our team to effectively and efficiently detect data signals from our equipment and our products and they are focused on unlocking new insights that will guide to continuous improvement throughout the manufacturing ecosystem.
Tom Ho, President, BISTel America stated that they are delighted to be able to work with a proven leader like NXP, and its commitment to excellence in manufacturing is indicated in the high quality and high performance of their products, mainly as it relates to their leadership in the automotive market.
W.K. Choi, CEO, BISTel stated that they are delighted at the high level of collaboration with NXP’s manufacturing team and value their relationship extremely and look forward to helping attain even greater efficiencies across each of the fabs in the USA and Europe.
